The Recent Advancement and Prospect of Scanning Probe Microscopy
Speaker : Dr. Sang-Joon Cho Affiliation : Park Systems Korea Region : Asia Year : 2022 Language : English Explore the advancements in Scanning Probe Microscopy (SPM). Delve into SPM's diverse applications, from semiconductor precision to nanoscale defect control and chemical identification in biological and environmental materials. Uncover the evolution of Atomic Force Microscopy (AFM) as a powerful tool in semiconductor metrology and beyond.
