Lithography on compact disk

Lithography on compact disk 2

Scanning Conditions

- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256

Application

AFM Exclusive

Related Modes

Lithography

Related Contents

Application Talks

Full control and automation on point with next-gen Atomic Force Microscopy
Application Talks

Unraveling the History of Atomic Force Microscopy
Application Talks

Computer vision and automated image processing for electrical AFM in 2D materials
×