Research AFM

AFM Modes

Park AFMs provide an extensive range of high-precision scanning modes, enabling accurate and efficient data collection across diverse sample types. Our industry-leading True Non-Contact™ Mode uniquely preserves tip sharpness and sample integrity by eliminating physical contact, ensuring long-term measurement reliability. From advanced Magnetic Force Microscopy to a suite of electrical and mechanical property measurement modes, Park AFMs offer unparalleled accuracy and innovation in atomic force microscopy.

Imaging Modes

Measure your sample’s surface with Park’s innovative AFM modes, including the world's unique True Non-Contact scanning and highly accurate standard modes.

Electrical Modes

Analyze your sample’s electrical properties with Park’s advanced scanning modes for detailed measurement of conductance, resistance, and other electrical/topographic characteristics.

Nanomechanical Modes

Measure your sample's mechanical properties with Park's accurate mechanical scanning modes, ensuring reliable data collection.

Special Modes

Explore other special modes to boost your AFM solutions further.